Method for detecting disturb phenomena between neighboring...

Details Method for detecting disturb phenomena between neighboring... Method for detecting disturb phenomena between neighboring...

2011-06-28

2011-06-28

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S002000, C714S005110, C714S006130, C714S006130, C714S006130, C714S025000, C714S042000, C714S710000, C714S715000, C714S718000, C714S719000, C714S723000, C714S799000, C365S185010, C365S201000, C365S196000, C365S185210, C365S189070, C365S185110, C365S185330, C711S103000, C711S165000

Reexamination Certificate

active

07971113

ABSTRACT:
A method for detecting disturb phenomena between neighboring blocks in non-volatile memory includes, sequentially erasing and writing test data (pattern) to each block of a plurality of blocks under test in the non-volatile memory at a first time point, dividing the plurality of blocks under test into a first block group and a second block group based on ordinal number included in each block of the plurality of blocks under test, reading data from each block of the first block group at a second time point, and comparing the data with the test data written at the first time point to generate a first detecting result, and determining applicability of each block of the first block group based on the first detecting result.

REFERENCES:
patent: 6999363 (2006-02-01), Chevallier
patent: 7818525 (2010-10-01), Frost et al.
patent: 2004/0015756 (2004-01-01), Chiu et al.
patent: 2007/0255889 (2007-11-01), Yogev et al.
patent: 2009/0109755 (2009-04-01), Edan et al.
patent: 2009/0307412 (2009-12-01), Yeh
Banerjee et al., “Built-In Self-Test for Flash Memory Embedded in SoC”, IEEE, Third Workshop on Electronic Design, 2005, 6 pages.

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