Method for detecting column fail by controlling sense...

Details Method for detecting column fail by controlling sense... Method for detecting column fail by controlling sense...

2008-06-03

2008-06-03

Phan, Trong (Department: 2827)

Static information storage and retrieval

Read/write circuit

Flip-flop used for sensing

C365S207000, C365S208000, C365S189080, C365S201000

Reexamination Certificate

active

07382671

ABSTRACT:
Disclosed is a method for detecting a column fail by controlling a sense amplifier of a memory device. The method includes the steps of enabling a word line of a memory cell of the memory device, adjusting a timing of a high-level driving voltage and a low-level driving voltage applied to the sense amplifier, and detecting an amplification result of the sense amplifier.

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