Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate
2009-01-29
2011-10-04
Smith, Matthew (Department: 2823)
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
C257SE21023
Reexamination Certificate
active
08030215
ABSTRACT:
Methods and apparatuses directed to high density holes and metallization are described herein. A method may include providing a dielectric layer including a plurality of holes, forming a fill material over a top surface of the dielectric layer and in the plurality of holes, and reflowing the fill material to substantially remove any voids in the plurality of holes. Other embodiments are also described.
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Chang Runzi
Sutardja Pantas
Fan Michele
Marvell International Ltd.
Smith Matthew
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