Method for creating ultra-high-density holes and metallization

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step

Reexamination Certificate

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C257SE21023

Reexamination Certificate

active

08030215

ABSTRACT:
Methods and apparatuses directed to high density holes and metallization are described herein. A method may include providing a dielectric layer including a plurality of holes, forming a fill material over a top surface of the dielectric layer and in the plurality of holes, and reflowing the fill material to substantially remove any voids in the plurality of holes. Other embodiments are also described.

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patent: 7564084 (2009-07-01), Song et al.
patent: 2003/0039893 (2003-02-01), Farnsworth et al.
patent: 2006/0263699 (2006-11-01), Abatchev et al.
patent: 2006/0263973 (2006-11-01), Thomas
patent: 2007/0048674 (2007-03-01), Wells
patent: 2007/0207620 (2007-09-01), Doebler
patent: 2007/0254472 (2007-11-01), Hayashi
patent: 2009/0142902 (2009-06-01), Subramanian

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