Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2011-05-24
2011-05-24
Trimmings, John P (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S002000, C714S005110, C714S006130, C714S006130, C714S006130, C714S025000, C714S030000, C714S042000, C714S710000, C714S718000, C714S719000, C714S733000, C714S734000, C714S736000, C714S742000, C369S053170, C711S001000, C711S100000, C711S202000, C711S206000, C365S200000, C365S201000
Reexamination Certificate
active
07949913
ABSTRACT:
A method for storing a memory defect map is disclosed whereby a memory component is tested for defects at the time of manufacture and any memory defects detected are stored in a memory defect map and used to optimize the system performance. The memory defect map is updated and the system's remapping resources optimized as new memory defects are detected during operation.
REFERENCES:
patent: 4209846 (1980-06-01), Seppa
patent: 4240143 (1980-12-01), Besemer et al.
patent: 4426688 (1984-01-01), Moxley
patent: 4479214 (1984-10-01), Ryan
patent: 5450576 (1995-09-01), Kennedy
patent: 5539697 (1996-07-01), Kim et al.
patent: 5588112 (1996-12-01), Dearth et al.
patent: 5666482 (1997-09-01), McClure
patent: 5671229 (1997-09-01), Harari et al.
patent: 5751641 (1998-05-01), Petrosino
patent: 5758056 (1998-05-01), Barr
patent: 5764878 (1998-06-01), Kablanian et al.
patent: 5774647 (1998-06-01), Raynham et al.
patent: 5862314 (1999-01-01), Jeddeloh
patent: 5867702 (1999-02-01), Lee
patent: 5905858 (1999-05-01), Jeddeloh
patent: 5986950 (1999-11-01), Joseph
patent: 5996096 (1999-11-01), Dell et al.
patent: 6035432 (2000-03-01), Jeddeloh
patent: 6052798 (2000-04-01), Jeddeloh
patent: 6125392 (2000-09-01), Labatte et al.
patent: 6154851 (2000-11-01), Sher et al.
patent: 6158025 (2000-12-01), Brisse et al.
patent: 6173382 (2001-01-01), Dell et al.
patent: 6237110 (2001-05-01), Lin et al.
patent: 6260127 (2001-07-01), Olarig et al.
patent: 6285607 (2001-09-01), Sinclair
patent: 6304989 (2001-10-01), Kraus et al.
patent: 6324657 (2001-11-01), Fister et al.
patent: 6460152 (2002-10-01), Demidov et al.
patent: 6499117 (2002-12-01), Tanaka
patent: 6499120 (2002-12-01), Sommer
patent: 6536005 (2003-03-01), Augarten
patent: 6600614 (2003-07-01), Lenny et al.
patent: 6601183 (2003-07-01), Larson et al.
patent: 6622269 (2003-09-01), Ngo et al.
patent: 6728907 (2004-04-01), Wang et al.
patent: 6820224 (2004-11-01), Lin et al.
patent: 6889305 (2005-05-01), Adelmann
patent: 7065630 (2006-06-01), Ledebohm et al.
patent: 7123051 (2006-10-01), Lee et al.
patent: 7246269 (2007-07-01), Hamilton
patent: 7251744 (2007-07-01), Housty
patent: 7269765 (2007-09-01), Charlton et al.
patent: 7272758 (2007-09-01), Roohparvar
patent: 7346755 (2008-03-01), Pomaranski et al.
patent: 7478285 (2009-01-01), Fouquet-Lapar
patent: 2001/0042225 (2001-11-01), Cepulis et al.
patent: 2002/0073353 (2002-06-01), Fish et al.
patent: 2002/0120826 (2002-08-01), Venkatraman et al.
patent: 2002/0108072 (2002-09-01), Beng Sim et al.
patent: 2002/0157048 (2002-10-01), Roohparvar
patent: 2002/0184445 (2002-12-01), Cherabuddi
patent: 2003/0005367 (2003-01-01), Lam
patent: 2003/0058711 (2003-03-01), Benedix et al.
patent: 2003/0095455 (2003-05-01), Dono et al.
patent: 2003/0145250 (2003-07-01), Chin
patent: 2003/0208654 (2003-11-01), Krontz et al.
patent: 2004/0034825 (2004-02-01), Jeddeloh
patent: 2004/0042293 (2004-03-01), Ogino
patent: 2004/0088614 (2004-05-01), Wu
patent: 2005/0022066 (2005-01-01), Herbst
patent: 2005/0120270 (2005-06-01), Anand et al.
patent: 2005/0149687 (2005-07-01), Adelmann
patent: 2006/0004942 (2006-01-01), Hetherington et al.
patent: 2006/0059383 (2006-03-01), Roohparvar
patent: 2006/0236165 (2006-10-01), Cepulis et al.
patent: 2007/0061637 (2007-03-01), Ward et al.
patent: 2007/0101238 (2007-05-01), Resnick et al.
patent: 2007/0136385 (2007-06-01), Abrashkevich et al.
patent: 2007/0136625 (2007-06-01), Niijima et al.
patent: 2007/0150777 (2007-06-01), Sasaki
patent: 2007/0174718 (2007-07-01), Fouquet-Lapar
patent: 2007/0217559 (2007-09-01), Stott et al.
patent: 2008/0229143 (2008-09-01), Muraki
patent: 2008/0247243 (2008-10-01), Kang et al.
patent: 0704854 (1996-04-01), None
patent: 2005-234744 (2005-09-01), None
patent: WO98/02816 (1998-01-01), None
patent: 9905599 (1999-02-01), None
patent: WO99/05599 (1999-04-01), None
patent: 9950748 (1999-10-01), None
USPTO Non-Final Rejection for U.S. Appl. No. 11/838,687, dated Mar. 10, 2009.
Supplementary European Search Report for EP 08 01 4498, dated Mar. 2, 2009.
Supplementary European Search Report for EP 08 01 4500, dated Mar. 2, 2009.
Singapore Office Action for Application No. 200805816-6, dated Mar. 30, 2009.
International Search Report and Written Opinion for Singapore Patent Application No. 200805821-6, dated May 4, 2009.
International Search Report and Written Opinion for Singapore Patent Application No. 200805817-4, dated May 28, 2009.
Partial European Search Report for EP 08 014 502.2 dated Aug. 11, 2009.
USPTO Final Rejection for U.S. Appl. No. 11/838,687, dated May 6, 2009.
USPTO Non-Final Rejection for U.S. Appl. No. 11/838,593, dated Nov. 4, 2009.
Partial European Search Report for 08014500.6, dated Nov. 12, 2008.
Partial European Search Report for 08014498.3, dated Nov. 12, 2008.
Wikipedia—“BIOS Interrupt Call”—http://en.wikipedia.org/wiki/bios—interrupt—call.
Wikipedia—“Interrupt Descriptor Table”—http://en.wikipedia.org/wiki/interrupt—descriptor—table.
USPTO Non-Final Rejection for U.S. Appl. No. 11/838,593 dated Jun. 8, 2010.
USPTO Non-Final Rejection for U.S. Appl. No. 11/838,602 dated Mar. 2, 2010.
Newell Tom L.
Norrod Forrest E.
Pike Jimmy D.
Baker & Botts L.L.P.
Dell Products L.P.
Trimmings John P
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