Static information storage and retrieval – Systems using particular element – Semiconductive
Reexamination Certificate
2006-08-08
2006-08-08
Auduong, Gene N. (Department: 2827)
Static information storage and retrieval
Systems using particular element
Semiconductive
C365S105000, C365S230060
Reexamination Certificate
active
07088613
ABSTRACT:
A method for controlling current fluctuations during read and program operations in a memory structure is provided. The method includes applying a first voltage to a first gate of a word line decoder transistor. The method further includes applying a second voltage to a second gate of a bit line decoder transistor such that the first voltage is greater than the second voltage. The method also includes maintaining the source voltage of the bit line decoder transistor at about zero.
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C. de Graaf et al., “A Novel High-density Low-Cost Diode Programmable Read Only Memory,”IEDM Tech. Digest(1996), pp. 189-192.
M. Crowley et al., “512Mb PROM with 8 Layers of Antifuse/Diode Cells,” 2003 IEEE International Solid-State Circuits Conference, Session 16, Paper 16.4 (10 pages).
Lee Ming-Hsiu
Lue Hang-Ting
Auduong Gene N.
Macronix International Co. Ltd.
Martine & Penilla & Gencarella LLP
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