Method for controlling a semiconductor processing apparatus

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing

Reexamination Certificate

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Details

C700S096000, C700S121000, C702S183000, C707S793000

Reexamination Certificate

active

07496422

ABSTRACT:
A method for controlling a batch-type semiconductor processing apparatus is provided. The method checks whether a recipe set based on basic process information is within a recipe group stored in the semiconductor processing apparatus. The method also checks whether the quantity of wafers read through lot mapping is correlated to the quantity of wafers indicated by the basic process information. During the semiconductor fabrication process, the method also checks whether a current recipe of the semiconductor processing apparatus is correlated to the set recipe.

REFERENCES:
patent: 5461559 (1995-10-01), Heyob et al.
patent: 6735493 (2004-05-01), Chou et al.
patent: 6957116 (2005-10-01), Tsai et al.
patent: 6975917 (2005-12-01), Sakamoto et al.
patent: 11-016798 (1999-01-01), None
patent: 1998-068085 (1998-10-01), None
patent: 1998-068320 (1998-10-01), None
patent: 1999-026068 (1999-04-01), None

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