Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-02-03
2008-08-05
Garbowski, Leigh Marie (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07409665
ABSTRACT:
A CAD apparatus designing patterns of a printed board. The apparatus includes a signal wiring pattern detecting unit for detecting a signal wiring pattern, and a guard ground detecting unit for tracing the signal wiring pattern along the longitudinal direction thereof, in order to detect whether or not a guard ground exists within a distance from the signal wiring pattern to a predetermined first discriminant value, identify a non-guard ground section within the distance to the first discriminant value, and to detect whether or not a guard ground exists within another distance from the signal wiring pattern to a second discriminant value, which is larger than the first discriminant value. The apparatus also includes a return path judging unit for judging an error of guard ground when no guard ground exists within the distance to the second discriminant value, thereby quickly checking a return path without mistake.
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European Search Report, Application No. EP 05 70 9686, Mar. 2006, 2 pages.
Fusayasu Hirotsugu
Hamada Seiji
Irikiin Miyoko
Mimura Shoichi
Garbowski Leigh Marie
Matsushita Electric - Industrial Co., Ltd.
Wenderoth , Lind & Ponack, L.L.P.
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