Method for characterizing a bit detection event

Details Method for characterizing a bit detection event Method for characterizing a bit detection event

2011-05-10

2011-05-10

Alphonse, Fritz (Department: 2112)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Error/fault detection technique

C714S776000, C714S785000

Reexamination Certificate

active

07941738

ABSTRACT:
A bit detection event within a read period is characterized by sub-dividing each read period into elementary time intervals. Certain ones of the elementary intervals are selected to for a window and a counting operation for a number of bits detected during the intervals within the window is performed. The elementary time intervals are defined by a difference between a frequency corresponding to the read period and a bit detection timing frequency. The counting result for the intervals in the window over several consecutive read periods is statistically processed. A reduction of an integrated electronic circuit test duration results from limiting the counting operations performed to the selected elementary time intervals.

REFERENCES:
patent: 5220581 (1993-06-01), Ferraiolo et al.
patent: 5371766 (1994-12-01), Gersbach et al.
patent: 6701140 (2004-03-01), Stine
patent: 2005/0025274 (2005-02-01), Rivoir
Preliminary French Search Report, FR 06 02386, dated Dec. 8, 2006.

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