Method for calculating remaining life of semiconductor disk devi

Details Method for calculating remaining life of semiconductor disk devi Method for calculating remaining life of semiconductor disk devi

1998-03-27

2000-07-18

Hua, Ly V.

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

H02H 305

Patent

active

060922214

ABSTRACT:
A method for calculating the remaining life of a semiconductor disk device including a step for calculating the number of sectors remained employable in the reserve area, a step for calculating the number of sectors which have been fully employed and the number of sectors which are under employment, the sectors being contained in the reserve area, a step for calculating a ratio of a sum of the number of sectors which have been fully employed and the number of sectors which are under employment and the number of sectors remained employable, and a step for calculating the remaining life of the semiconductor disk device employing the ratio.

REFERENCES:
patent: 5233610 (1993-08-01), Nakayama et al.
patent: 5819100 (1998-10-01), Pearce
patent: 5867809 (1999-02-01), Soga et al.

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