Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Reexamination Certificate
2007-12-25
2007-12-25
McPherson, John A. (Department: 1756)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making electrical device
C430S313000, C438S690000
Reexamination Certificate
active
10676090
ABSTRACT:
A resist film is applied to an entire surface and subjected to patterning substantially in the same form as an opening to bury the resist film inside the opening. When a positive resist is used, a photomask having a light-shielding portion with an area smaller than the opening is used in patterning. When a negative resist is used, a photomask having a light transmitting portion with an area smaller than the opening is used.
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patent: 1009687 (1987-03-01), None
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patent: 9-321046 (1997-12-01), None
Chacko-Davis Daborah
Leydig , Voit & Mayer, Ltd.
McPherson John A.
Renesas Technology Corp.
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