Method for built-in self-testing of ring-address FIFOs having a

Details Method for built-in self-testing of ring-address FIFOs having a Method for built-in self-testing of ring-address FIFOs having a

1997-10-08

1999-11-02

Hua, Ly V.

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

714 54, 714 40, G06F 1100

Patent

active

059789352

ABSTRACT:
A dual-port RAM-type ring-address FIFO including a data input register with a set of transparent latches is tested by causing the FIFO to execute a test method comprised of a set of interwoven steps. Upon execution, the steps of the method cause the FIFO to manifest all possible memory, address and functional faults. This test method manifests faults by causing the FIFO to alter the state of various flags it normally sets and by altering the logic state of the data normally produced by the FIFO.

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