Method for automatically sizing and biasing circuits by...

Details Method for automatically sizing and biasing circuits by... Method for automatically sizing and biasing circuits by...

2006-06-06

2006-06-06

Thompson, A. M. (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

07058916

ABSTRACT:
In a method of automatically sizing and biasing a circuit, a database is provided including a plurality of records related to cells that can be utilized to form an integrated circuit. A cell parameter of a cell for a circuit is selected and compared to cell parameters residing in the records stored in the database. One record in the database is selected based upon this comparison and a performance characteristic of the circuit is determined from this record.

REFERENCES:
patent: 5513119 (1996-04-01), Moore et al.
patent: 5757655 (1998-05-01), Shih et al.
patent: 6131182 (2000-10-01), Beakes et al.
patent: 6490715 (2002-12-01), Moriwaki et al.
patent: 6529913 (2003-03-01), Doig et al.
patent: 6539533 (2003-03-01), Brown et al.
patent: 2002/0175713 (2002-11-01), Knowles

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