Method for automatically extracting a functional coverage...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000, C703S013000, C703S014000, C714S724000, C714S728000, C714S738000, C714S739000, C714S741000

Reexamination Certificate

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07904846

ABSTRACT:
A computer is programmed to automatically generate in memory, goals for functional verification of a design of a circuit by use of constraints that are specified in the normal manner. Specifically, a predetermined set of rules are automatically applied to the constraints, on random values for signals to be input to the circuit during simulation of the design. Application of the rules identifies one or more templates of goal(s) to be met. The computer is programmed to automatically use constraint(s) and template(s) to instantiate goal(s) in memory. Each goal identifies a signal to be input to the circuit, and defines a counter for a value of the signal. The goals are used in the normal manner, i.e. used to measure coverage of functional verification during simulation of the design of the circuit.

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