Method for automatically defining a part model for...

Details Method for automatically defining a part model for... Method for automatically defining a part model for...

2006-05-30

2006-05-30

Do, Thuan (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000

Reexamination Certificate

active

07055112

ABSTRACT:
The present invention provides a method for automatically defining a part model for a semiconductor component. An image of the component is provided. The automatic method may be any of a trial and error method, systematic method or a method based on distance-angle signatures. The trial and error method is described in the context of defining a part model for a ball grid array. The systematic approach is described in the context of a leaded semiconductor, and the distance angle signature approach is described in the context of defining a part model for an odd form semiconductor component.

REFERENCES:
patent: 6115042 (2000-09-01), Li et al.
patent: 6141009 (2000-10-01), Li et al.
patent: 6151406 (2000-11-01), Chang et al.
patent: 6173070 (2001-01-01), Michael et al.
patent: 6501554 (2002-12-01), Hackney et al.

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