Optics: measuring and testing – With sample preparation
Patent
1994-06-27
1995-09-19
McGraw, Vincent P.
Optics: measuring and testing
With sample preparation
G01N 104
Patent
active
054520703
ABSTRACT:
A method for analyzing solid sample comprises the steps of: introducing an inert carrier gas into a cell; a preliminary treatment step of irradiating laser beam to a sample surface of the solid sample in the inert carrier gas, the laser beam having a pulse half width of 0.001 .mu.sec or more, a pulse energy density of 0.001 GW/cm.sup.2 or more, and a frequency of 100 Hz or more; generating fine particles in the inert carrier gas on a condition that a rate of fine particles generation, V (.mu.g/sec), and selection ratio, S, satisfy the following equations, the selection ratio being a retio of a concentration of a target element for analysis within the fine particles to a concentration of the target element for analysis within the solid sample;
REFERENCES:
6th Process Technology Conference on Measurement and Control Instrumentation in the Iron and Steel Industry, Apr. 1985, Detroit, US. pp. 157-161, D. A. Cremers et al "Rapid Analysis of Steels Using Laser-Based Techniques".
Applied Spectroscopy, vol. 42, No. 7, 1988, Baltimore, US pp. 1231-1239-P. Arrowsmith et al "Entrainment and Transport of Laser Ablated Plumes for Subsequent Elemental Analysis".
Analytical Sciences, vol. 5, No. 5, Oct. 1989, pp. 535-538, T. Mochizuki et al, "Direct Analysis of Steels by Inductively Coupled Plasma Emission Spectrometry with a Q-Switched Neodymium: Yag Laser".
Analytical Sciences, vol. 7, No. 3, Jun. 1991, pp. 479-481, T. Mochizuki et al, "Selective Vaporization in Laser Ablation Solid Sampling for Inductively Coupled Plasma Atomic Emission and Mass Spectrometry of Steels".
"Rapid Analysis of Steels Using Laser-Based Techniques", D. A. Creme, 6th Process Technology Conference on Measurement and Control Instrumentation in the Iron and Steel Industry, Detroit, Mich., Apr. 14-17, 1985.
Akiyoshi Takanori
Ishibashi Yohichi
Iwata Yoshihito
Kinoshiro Satoshi
Mochizuki Tadashi
McGraw Vincent P.
NKK Corporation
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