Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-07-03
2007-07-03
Williams, Hezron (Department: 2856)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C073S03200R, C702S023000, C702S032000, C702S108000, C702S117000, C702S189000
Reexamination Certificate
active
10609068
ABSTRACT:
A method for determining material density variations and prediction of defects on a multi-layer printed circuit board (PCB), in the X, Y, and Z axis, includes a virtual grid creation system and a set of rules for determining the material density in each grid element in the grid system.
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Greenberg Traurig LLP.
Shah Samir M.
TTM Technologies, Inc.
Williams Hezron
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