Method for adjusting sensor characteristics of humidity sensor

Measuring and testing – Instrument proving or calibrating – Gas or liquid analyzer

Reexamination Certificate

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Reexamination Certificate

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11362822

ABSTRACT:
An inspection device inspects a humidity sensor having a sensor portion and a circuit portion, which are integrated into one chip. The inspection device includes: an inspection chamber for accommodating a wafer, in which a plurality of humidity sensors are disposed as a sensor chip in a wafer state; a probe for contacting an electrode pad of the circuit portion; a tester electrically connected to the probe for inspecting electric properties of the humidity sensor; and a temperature-humidity control portion for controlling a temperature and a humidity in the inspection chamber.

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patent: A-6-349909 (1994-12-01), None
patent: A-9-298225 (1997-11-01), None
patent: A-2003-28824 (2003-01-01), None

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