X-ray or gamma ray systems or devices – Specific application – Lithography
Reexamination Certificate
2006-06-13
2006-06-13
Slick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Lithography
C250S492100
Reexamination Certificate
active
07062010
ABSTRACT:
There is provided a method of making a gap between first and second objects have a predetermined value. The method includes steps of introducing light to an entry window on the first object, detecting an intensity of light from an exit window on the first object, the exit window being at such a position that light would enter through the entry window of the first object, reflect on the second object, and then enter the exit window of the first object if the gap has the predetermined value, and positioning the second object, with respect to a direction concerning the gap, based on an intensity of light detected in the detecting step.
REFERENCES:
patent: 4085329 (1978-04-01), McCoy et al.
patent: 4187431 (1980-02-01), Hundt
patent: 5114236 (1992-05-01), Matsugu et al.
patent: 5151754 (1992-09-01), Ishibashi et al.
patent: 5239183 (1993-08-01), Kouno et al.
patent: 5291023 (1994-03-01), Hasegawa et al.
patent: 6144719 (2000-11-01), Hasegawa et al.
patent: 6154281 (2000-11-01), Sentoku et al.
patent: 2003/0020891 (2003-01-01), Tokita
Canon Kabushiki Kaisha
Kao Chih-Cheng Glen
Morgan & Finnegan , LLP
Slick Edward J.
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