Method, apparatus and system for voltage screening of integrated

Details Method, apparatus and system for voltage screening of integrated Method, apparatus and system for voltage screening of integrated

1998-01-13

1999-12-07

Nelms, David

Static information storage and retrieval

Read/write circuit

Testing

365226, G11C 700

Patent

active

059994665

ABSTRACT:
A method, apparatus and system for cost-effectively quantifying the likelihood of operational reliability problems includes a supply voltage configuration circuit and a test mode generation circuit. The test mode generation circuit and supply voltage configuration circuit, operating together in a test mode, provide selected supply voltages to selected circuit blocks of an integrated circuit. In non-test operation, the test mode generation circuit and the supply voltage configuration circuit are transparent to the operation of the tested integrated circuit.

REFERENCES:
patent: 5258954 (1993-11-01), Furuyama
patent: 5272673 (1993-12-01), Sugibayashi
patent: 5357193 (1994-10-01), Tanaka et al.
patent: 5424990 (1995-06-01), Ohsawa
patent: 5426616 (1995-06-01), Kajigaya et al.
patent: 5568435 (1996-10-01), Marr
patent: 5568436 (1996-10-01), Furuyama

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