Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2011-03-01
2011-03-01
Bella, Matt (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S140000, C382S144000, C382S145000, C382S147000, C382S149000, C382S151000
Reexamination Certificate
active
07899237
ABSTRACT:
An embodiment relates generally to a method of testing a mixed signal device. The method includes monitoring multiple parameters of the mixed signal device and scanning the mixed signal device with an optical source. The method also includes forming multiple windows, where each window is assigned to a respective parameter. The method further includes comparing an image from a respective image to a reference image to determine an existence of an anomaly.
REFERENCES:
patent: 5430305 (1995-07-01), Cole et al.
patent: 7038474 (2006-05-01), McGinnis et al.
patent: 7184906 (2007-02-01), Fender et al.
Anjum Naweed
Maxwell David
Nguyen Dat T.
To Thao
Bella Matt
Brady Wade J.
Franz Warren L.
Rahmjoo Mike
Telecky , Jr. Frederick J.
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