Method, apparatus and program product to concurrently...

Details Method, apparatus and program product to concurrently... Method, apparatus and program product to concurrently...

2007-02-12

2010-02-09

Tu, Christine T (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S815000, C714S031000, C714S006130, C714S719000, C714S710000

Reexamination Certificate

active

07661044

ABSTRACT:
Method and system for repairing memory failure in a computer system in one aspect determines one or more test patterns and time duration for testing the new memory unit that replaced a failed memory unit. The test pattern is written to the new memory unit and read from the new memory unit. The read pattern is compared to the test pattern that was used to write. If the read test pattern and the written test pattern doe not match, a further repair action is taken. If they match, writing and reading of the test pattern repeats until the time duration for testing expires. The new memory unit may be configured as available for use when the write and read test completes successfully for the testing time duration.

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