Method, apparatus and computer program product for...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C716S030000, C716S030000

Reexamination Certificate

active

07454721

ABSTRACT:
A method, apparatus, and computer program product for optimizing the layout of an integrated circuit design. Base ground rules and recommended ground rules are prioritized according to the impact they have on the yield of the integrated circuit design. The layout is optimized according to the prioritized base ground rules and recommended ground rules.

REFERENCES:
patent: 5535134 (1996-07-01), Cohn et al.
patent: 5842192 (1998-11-01), Garcia et al.
patent: 6182271 (2001-01-01), Yahagi
patent: 6189132 (2001-02-01), Heng et al.
patent: 6704921 (2004-03-01), Liu
patent: 6745372 (2004-06-01), Cote et al.
patent: 6802050 (2004-10-01), Shen et al.
patent: 7076749 (2006-07-01), Kemerer et al.
patent: 7240305 (2007-07-01), Lippincott
patent: 7257783 (2007-08-01), Allen et al.
patent: 2005/0188338 (2005-08-01), Kroyan et al.
patent: 2006/0085773 (2006-04-01), Zhang
patent: 2006/0095889 (2006-05-01), Cote et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method, apparatus and computer program product for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method, apparatus and computer program product for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method, apparatus and computer program product for... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4040367

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.