Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
1998-07-28
2001-09-11
Hjerpe, Richard (Department: 2674)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S028000, C714S724000, C714S728000, C714S731000
Reexamination Certificate
active
06289472
ABSTRACT:
TECHNICAL FIELD OF THE INVENTION
This invention relates generally to testing systems and methods, and more particularly to testing with multiple modes.
BACKGROUND OF THE INVENTION
In many industries, testing systems (“testers”) are utilized to test a product, for example, at various points during manufacture. Such testers may be refined over time as different embodiments or versions. Often, when a new version of a tester is created, it will not be compatible—i.e., capable of being used—with previous versions because the new version may comprise components which differ from the older versions. Furthermore, newer versions often do not operate in the same manner as previous versions. This gives rise to numerous problems.
For example, testing under a new version of a tester may so completely differ from testing under a previous version that separate operating techniques and/or software is required. Thus, when a new version of a tester is brought into a production facility which already utilizes previous versions of that same tester, new software and operating methods must be developed or learned in order to use the new version. Valuable resources, such as the time of operators and programmers, must be expended during the necessary development and learning.
Furthermore, a new version of a tester may not be able to perform exactly the same tests as an older version. Thus, in some cases, if a specific test is required, one version of a tester may not be used if that test can only be performed by another version. Accordingly, some versions of a tester may be idle even when other versions are being over-worked.
SUMMARY OF THE INVENTION
In accordance with the present invention, the disadvantages and problems associated with prior testers and corresponding techniques for their use have been substantially reduced or eliminated.
According to an embodiment of the present invention, a testing system includes a testing hardware subsystem which can perform testing under a plurality of testing modes. Each testing mode corresponds to the operation of a particular version of a tester. A control subsystem is coupled to the testing hardware subsystem. The control subsystem can direct the testing hardware subsystem to test under one of the plurality of testing modes at a given moment.
According to another embodiment of the present invention, a method for testing includes the following steps: receiving specification information and testing routine information; processing the specification information and testing routine information in order to generate programming information; initializing a testing hardware subsystem using the programming information so that the testing hardware subsystem can perform testing under a plurality of testing modes, each testing mode corresponding to the operation of a particular version of a tester; and directing the testing hardware subsystem to test under one of the plurality of testing modes at a given moment.
Important technical features of the present invention include providing a testing system with multiple testing modes, wherein each testing mode may correspond to the operation of a particular version of the same tester. The different testing modes allow product to be moved and tested on any testing system with available capacity, thereby reducing the likelihood that the testing system will be idle because it is unable to test under a particular mode.
Yet another important technical advantage of the present invention includes providing flexibility with regard to testing decisions. During a particular session or execution of testing, the testing system may be run in any one or more of the various testing modes, thereby taking advantage of the efficiencies provided by or inherent to different versions of the tester. Alternatively, a single testing mode may be specified so that a user, such as an operator, can operate the tester in a testing mode for which he or she is trained or familiar.
Other technical advantages are readily apparent to one skilled in the art from the following figures, description, and claims.
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Antheunisse William J.
Whitaker Joseph W.
Brady III W. James
Hernandez Pedro P.
Hjerpe Richard
Monestime Mackly
Telecky Frederick J.
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