Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate
2004-02-20
2008-10-14
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Replacement of memory spare location, portion, or segment
C714S723000, C365S200000
Reexamination Certificate
active
07437627
ABSTRACT:
Method for determining a repair solution for a memory module in a test system, memory areas of the memory module being successively tested in order to obtain, for each memory area, a defect datum which specifies whether the respective memory area is defective, wherein defect addresses, the address values of which specify the defective memory areas of the memory module, are generated from addresses of the memory areas and the associated defect data, the defect addresses being stored in the test system, the repair solution being determined from the stored defect addresses.
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Examination Report dated Feb. 20, 2004.
Britt Cynthia
Infineon - Technologies AG
Patterson & Sheridan L.L.P.
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