Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-08-29
2006-08-29
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
Reexamination Certificate
active
07100135
ABSTRACT:
A system to evaluate a distance between polyline segments includes identification of a first polyline and a second polyline associated with a differential signal, determination of whether a distance between a segment of the first polyline and a segment of the second polyline is within a first tolerance, and, if the distance is not within the first tolerance, determining whether the distance is within a second tolerance. If the distance is not within the first tolerance and is within the second tolerance, it is determined whether the length of the segment of the first polyline is less than a first threshold. If the distance is not within the first tolerance and is within the second tolerance, and if the length of the segment of the first polyline is less than the first threshold, it is indicated that the first polyline and the second polyline are sufficiently spaced. If the distance is not within the second tolerance or if the length of the segment of the first polyline is greater than the first threshold, it is determined whether the segments are located near a device pin, and, if the segments are not located near a device pin, it is indicated that the first polyline and the second polyline are not sufficiently spaced.
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Garrison Gene
Genz Lee
McRonald Andrew
Meyer Neal
Neal Brett
Buckley Maschoff & Talwalkar LLC
Dinh Paul
Parihar Suchin
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