Method and system of trace pull test

Details Method and system of trace pull test Method and system of trace pull test

2008-01-15

2008-01-15

Pert, Evan (Department: 2826)

Semiconductor device manufacturing: process

With measuring or testing

Electrical characteristic sensed

C438S014000, C324S765010

Reexamination Certificate

active

07319043

ABSTRACT:
The present invention provides an efficient test method and system for testing the IC package, such as BGA types of packages. With the present invention, manufacturer can have an easier way in testing various types of packages, including newer types. Manufacturer also can get the testing outcome which is more accurate. Furthermore, the present invention helps the manufacturer achieve a significant improvement in an IC packaging process.

REFERENCES:
patent: 5275058 (1994-01-01), Pham et al.
patent: 5533398 (1996-07-01), Sakurai
patent: 5675179 (1997-10-01), Shu et al.
patent: 5686670 (1997-11-01), Vanderlip
patent: 6094144 (2000-07-01), Dishongh et al.
patent: 6133052 (2000-10-01), Ichihara
patent: 6452502 (2002-09-01), Dishongh et al.
patent: 6568581 (2003-05-01), Boller et al.
patent: 6758385 (2004-07-01), Farassat
patent: 6790759 (2004-09-01), Wang et al.
patent: 2005/0225344 (2005-10-01), Kirby
patent: 2006/0103399 (2006-05-01), Kuo
patent: 2006/0194353 (2006-08-01), Spuhler et al.

Affiliated with

Also associated with

Rating

Method and system of trace pull test does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system of trace pull test, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system of trace pull test will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2782702