Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-10-24
2010-10-26
Rossoshek, Helen (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C430S005000, C430S030000
Reexamination Certificate
active
07823103
ABSTRACT:
A method and system for validating a design rule checking program. The method and system includes creating a hierarchal structure such that each layer of the hierarchal structure corresponds to a process layer of a device or subregion of a shape. The method and system further includes inserting the created hierarchical structure into a DRC program and running the DRC program at least once with hierarchical optimization options turned off. The method and system compares the expected results with actual results. The differences between the expected results and the actual results actual results indicate errors in the DRC program.
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JP2004037989.
International Business Machines - Corporation
Kotulak Richard
Roberts Mlotkowski Safran & Cole
Rossoshek Helen
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