X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Reexamination Certificate
2006-12-12
2006-12-12
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Computerized tomography
C378S005000
Reexamination Certificate
active
07149278
ABSTRACT:
A method and system of counting and tagging radiation energy received by a radiation detector is presented. The method and system are designed to dynamically control the sampling window or shaping time characteristics of a photon counting detector to accommodate variations of flux experienced by the detector so as to preserve optimum detector performance and prevent saturation during high flux conditions.
REFERENCES:
patent: 5165100 (1992-11-01), Hsieh et al.
patent: 5400378 (1995-03-01), Toth
patent: 5416815 (1995-05-01), Hsieh
patent: 2002/0001365 (2002-01-01), Mazor et al.
Arenson Jerome
Hoffman David M.
Della Penna Michael A.
General Electric Company
Glick Edward J.
Horton Carl B.
Song Hoon
LandOfFree
Method and system of dynamically controlling shaping time of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system of dynamically controlling shaping time of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system of dynamically controlling shaping time of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3703108