Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-02-21
2006-02-21
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07003743
ABSTRACT:
A method of optimizing a design is disclosed, wherein a target element contributing to an undesirable characteristic in an original netlist is modified to create a modified netlist. A set of test vectors identifying differences between the original netlist and the modified netlist is identified and used to identify a set of corrections. In one disclosed embodiment, the set of corrections is identified by using an error correction algorithm. Each correction of the set of corrections, when applied to the modified netlist, results in a corrected netlist logically the same as the original netlist. One of the corrections is selected that improves the error characteristic of the original netlist. A final equivalency verification is performed as necessary.
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Abadir Magdy S.
Veneris Andreas
Do Thuan
Freescale Semiconductor Inc.
Toler Larson & Abel, LLP
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