Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-01-15
2008-01-15
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C714S047300, C714S728000
Reexamination Certificate
active
07320114
ABSTRACT:
A method provides for verifying soft error handling in an integrated circuit (IC) design. A diagnostic program is executed on a virtual IC based on the IC design using a simulator. A soft error is injected into the virtual IC to trigger hardware error correction in the virtual IC and a software exception. A record of a type and a location of the soft error at the time of the injecting is created. The error log generated by hardware error correction is then compared with the record of injected error, the hardware error correction being part of the virtual IC. An IC design flaw is indicated when a discrepancy exists between the error log and the record of the injected error.
REFERENCES:
patent: 5944842 (1999-08-01), Propp et al.
patent: 6983414 (2006-01-01), Duschatko et al.
patent: 2004/0034820 (2004-02-01), Soltis et al.
patent: 2005/0172196 (2005-08-01), Osecky et al.
Chan Kenneth K.
Jain Prashant
Ju Chishein
Palanisamy Kumarasamy
Dinh Paul
Martine & Penilla & Gencarella LLP
Sun Microsystems Inc.
LandOfFree
Method and system for verification of soft error handling... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for verification of soft error handling..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for verification of soft error handling... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2768743