Method and system for testing RAM redundant integrated circuits

Details Method and system for testing RAM redundant integrated circuits Method and system for testing RAM redundant integrated circuits

2007-10-16

2007-10-16

Chung, Phung My (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C365S201000, C365S096000

Reexamination Certificate

active

11043377

ABSTRACT:
System and method of testing a packaged random access memory (RAM) redundant integrated circuit die comprising: identifying a failed element in the redundant RAM of the packaged integrated circuit die; and replacing the failed element with a redundant element in the redundant RAM of the packaged integrated circuit die.

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