Method and system for testing devices using loop-back pseudo...

Details Method and system for testing devices using loop-back pseudo... Method and system for testing devices using loop-back pseudo...

2007-10-25

2010-06-01

Kerveros, James C (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Transmission facility testing

C714S724000

Reexamination Certificate

active

07730367

ABSTRACT:
There is provided a method of testing a first device using a tester. The method includes receiving test data having a pattern by the first device from the tester; detecting the pattern of the test data by the first device; generating first data, by the first device, according to the pattern detected by the detecting; comparing the test data with the pattern detected by the detecting; determining errors in the test data, by the first device, based on the comparing; inserting the errors into the first data to generate error-inserted first data; and transmitting the error-inserted first data by the first device to the tester. The method may further include generating a first clock at the first device; wherein the transmitting uses the first clock for transmitting the error-inserted first data.

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