Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reissue Patent
2006-11-15
2008-10-14
Iqbal, Nadeem (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C710S005000
Reissue Patent
active
RE040541
ABSTRACT:
The present invention generally relates to the field of testing computing devices. More specifically, the present invention relates to a system and method for testing a universal serial bus (“USB”) within a computing device. In an exemplary embodiment, the system includes a test device and a test control module. The test device is connected to a USB port on the computing device. The test control module resides on the computing device and interacts with the test device to test the USB port. Once connected, the test device is used to monitor signals on the USB port exchanged between the test device and the USB port. Examples of signals that are monitored are the voltage levels, frame timing, and USB bus signals and power voltages. The test device then communicates the monitored information to the test control module for analysis. The test control module is further capable of causing a second set of tests to be performed including a full-speed device detect test, a bulk transfer test, an isochronous transfer test, an interrupt transfer test, and a low-speed device detect test. The results of these tests are then communicated to the user.
REFERENCES:
patent: 5859993 (1999-01-01), Snyder
patent: 6311294 (2001-10-01), Larky et al.
patent: 6343260 (2002-01-01), Chew
patent: 6389560 (2002-05-01), Chew
patent: 6393588 (2002-05-01), Hsu et al.
patent: 6480801 (2002-11-01), Chew
patent: 6577979 (2003-06-01), Okitaka
patent: 6605966 (2003-08-01), Chen et al.
patent: 6701401 (2004-03-01), Lu et al.
patent: 6732301 (2004-05-01), Landry et al.
Archive of “Diagnostics Hardware and Software for PCT testing and repair—Ultra-X. . .”www.uxd.com, [online][Archived by http://archive.org on Jun. 20, 2000; Retrieved on Mar. 23, 2006] Retrieved from the Internet<URL:http://web.archive.org/web/20000620000644/http://www.uxd.com>.
Archive of “Diagnostics Hardware and Software for PCT testing and repair—Ultra-X. . .” www.uxd.com, [online] [Archived by http://archive.org on Jun. 20, 2000; Retrieved on Jul. 5, 2006] Retrieved from the Internet<URL:http://web.archive.org/web/20000620000644/http://www.uxd.com>.
Archive of “Hardware Diagnostic Tools—Ultra-X, Inc.,” www.uxd.com/hproducts. . ., [online] [Archived by http://archive.org on Aug. 17, 2000; Retrieved on Mar. 23, 2006] Retrieved from the Internet<URL:http://web.archive.org/web/20000817115611/www.uxd.com/hproducts. . .>.
Archive of “*** New Release*** —Quick Tech USB Tester,” www.uxd.com/qtu... , [online] [Archived by http://archive.org on Jan. 7, 2001; Retrieved Mar. 23, 2006] Retrieved from the Internet<URL:http://web.archive.org/web/20010107145600/http://www.uxd.com/qtu...>.
Archive of “Sycard Technology,” www,sycard.com, [online] [Archived by http://archive.org on Jun. 14, 1998; Retrieved on Jul. 27, 2006] Retrieved from the Internet<URL:http://web.archive.org/web/19980614222343/http://www.sycard.com/>.
Archive of “TradeShows—Ultra-X, Inc.,” www.uxd.com/tradeshowshtml [online] [Archived by http://archive.org on Nov. 21, 2000; retrieved on Jul. 5, 2006] Retrieved from the Internet<URL:http://web.archive.org/web/20001121033900/uxd.com/tradeshows.html>.
Archive of “Universal Serial Bus Debugger—USBdebug700, ” www.sycard,com/usbdebug.html, [online] [Archived by http://archive.org on Jun. 14, 1998; Retrieved on Jul. 27, 2006] Retrieved from the Internet<http://web.archive.org/web/19980614222531/www.sycard.com/usbdebug.html>.
Archive of “Universal Serial Bus Debugger—USBdebug700,” www.sycard.com/usbdebug.html, [online] [Archived by http://archive.org on Dec. 7, 1998; Retrieved on Jul. 27, 2006] Retrieved from the Internet<URL:http://web.archive.org/web/19981207005128/www.sycard.com/usbdebug.html>.
Archive of “Universal Serial Bus Port Tester—USBtest 2000,” www.scycard.com/usbtest.html, [online] [Archived by http://archive.org on Dec. 6, 1998; Retrieved on Jul. 27, 2006] Retrieved from the Internet<URL:http://web.archive.org/web/19981206073754/www.sycard.com/usbtest.html>.
Archive of “www.sycard.com,” www.sycard.com/index.html, [online] [Archived by http://archive.org on Dec. 5, 1998; Retrieved on Jul. 27, 2006] Retrieved from the Internet<URL:http://web.archive.org/web.archive.org/web/19981205191905/http://www.sycard.com/index.html>.
“CATC Announces Industry's First Production Test Tool for USB Hubs,” LeCroy Corporation, 2006, [online] [retrieved on Jul. 27, 2006] Retrieved from the Internet<URL:http://www.lecroy.com/Product/Press/CATC_Archive/012400_UPT.asp?news_id=607&menuid=40>.
“CATC Announces Industry's First Production Test Tool for USB Hubs,” Jan. 24, 2000, 2 pages.
“CATC Introduces The First USB/Ethernet Link,” Aug. 16, 1999, 3 pages.
“CATC™ UPT™ Universal USB Port Tester User's Manual,” Computer Access Technology Corporation, Sep. 22, 2000, 46 pages.
“Comdex Guide Program & Exhibits Guide,” Fall 2000, Nov. 13-17, 2000, 2 pages.
Computer Service & Support, Sep./Oct. 2000, pp. 32-33.
“Dealer Info: Bedrijfsprofielen,” Aug. 18, 2000, 1 page.
“Dealer Info: Productnieuws,” Aug. 18, 2000, 1 page.
“Dealer Info: VIA-Cyrix: come-back van de budget-CPU,” Aug. 18, 2000, 1 page.
Email from Stuart Ting to Anoop Singh (Jun. 9, 2000) re News—New Product Release—QuickTech USB, 2 pages.
Email from Stuart Ting to Anoop Singh (Jul. 13, 2000) re ***New Release***—QuickTech USB Port Tester from Ultra-X Inc., 2 pages.
“News—New Product Release—QuickTech USB,” Ultra-X, Inc., 2000, [Online] [Retrieved on Jul. 5, 2006] Retrieved from the Internet<URL:http://www.uxd.com
ews.html>.
“PC Computer Hardware Diagnostic Tools—Ultra-X, Inc.,” Updated Apr. 7, 2001, [online] [retrieved on Mar. 23, 2006] Retrieved from the Internet<URL:http://www.uxd.com/hproducts.htm>.
“Product Brief: USBdebug 700, Universal Serial Bus Monitor,” Sycard Technology, 1 page.
“Professional PC Diagnostic Tool Kits,” Ultra-X Incorporated, 8 pages.
“Professional PC Diagnostic Tool Kits,” UX, 8 pages.
“QuickTech USB-poort tester,” Ultra-X Benelux, 1 page.
“QuickTech-USB™ User's Guide,” Ultra-X, Inc., 1998-2000, 11 pages.
“Real World Technologies—Ultra-X Quick Tech USB Tester, ” Real World Technologies, 1996-2001, [online] [Retrieved on Jun. 29, 2006] Retrieved from the Internet<URL:http://www.realworldtech.com/includes/templates/articles.cfm?ArticleID=RWT013001000000&mode...>.
“Sycard Technology—USB Products,” Sycard Technology, Updated Aug. 9, 1999, [online] [Retrieved on Jul. 27, 2006] Retrieved from the Internet<URL:http://www.sycard.com/usb.html>.
“Sycard Technology USBtest 2000 Universal Serial Port Tester,” Sycard Technology, Updated Nov. 25, 2002, [online] [Retrieved on Jul. 27, 2006] Retrieved from the Internet<URL:http://www.sycard.com/usbtest.html>.
“2001/Feb Ultra-X marketing Guide,” Ultra-X Incorporated, 8 pages.
“Ultra-X Launches QuickTech USB, USB Port and Hub Tester,” New Product Releases, Mar. 23, 2006, 2 pages.
“+++USB Diagnosis made easy with QuickTech USB/Ultra-X (UK) Ltd.,” Jun. 30, 2000, [online] [Retrieved on Jun. 15, 2006] Retrieved from the Internet<URL:http://computer.prarchive.com/en/pr35298.htm>.
“USB Diagnosis made with easy with QuickTech USB,” PRWeb, 1997-2006, [online] [Retrieved Jun. 15, 2006] Retrieved from the Internet<URL:http://www.prweb.com/releases/2006/6/prweb/15937.htm>.
“USBdebug 700 User's Manual,” Sycard Technology, Jun. 1998, 8 pages.
“USBdebug 700 User's Manua
Fenwick & West LLP
Iqbal Nadeem
PC-Doctor Inc.
LandOfFree
Method and system for testing a universal serial bus within... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for testing a universal serial bus within..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for testing a universal serial bus within... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4005617