Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2005-11-10
2010-12-28
Bali, Vikkram (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S143000, C382S149000, C382S209000
Reexamination Certificate
active
07860296
ABSTRACT:
A test system includes a rotatable turntable, a loading section, a first image pickup section, a second image pickup section, a system control section and an unloading section. The loading section loads a display panel assembly onto the stage. The loading section recognizes a unique number of the display panel assembly. The first image pickup section obtains an active area image data from an active area image. A valid first active area defect is detected using an active area image data obtained from an active area image displayed on the display panel assembly. An inactive area defect is detected based on an inactive area image data and a reference inactive area image data.
REFERENCES:
patent: 4940934 (1990-07-01), Kawaguchi et al.
patent: 5184082 (1993-02-01), Nelson
patent: 5235272 (1993-08-01), Henley
patent: 5256578 (1993-10-01), Corley et al.
patent: 5363037 (1994-11-01), Henley et al.
patent: 5850205 (1998-12-01), Blouin
patent: 5917935 (1999-06-01), Hawthorne et al.
patent: 5966458 (1999-10-01), Yukawa et al.
patent: 6483937 (2002-11-01), Samuels
patent: 6716588 (2004-04-01), Sammak et al.
patent: 7110104 (2006-09-01), Choi et al.
patent: 7166856 (2007-01-01), Cho et al.
patent: 7358517 (2008-04-01), Caldwell
patent: 7388978 (2008-06-01), Duvdevani et al.
patent: 2002/0163527 (2002-11-01), Park
patent: 2003/0081825 (2003-05-01), Mitterholzer
patent: 2004/0027636 (2004-02-01), Miles
patent: 2006/0109391 (2006-05-01), Huitema et al.
patent: 2000-231347 (2000-08-01), None
patent: 2000-267131 (2000-09-01), None
patent: 2000-284722 (2000-10-01), None
patent: 2000-321545 (2000-11-01), None
patent: WO 98-48403 (1998-10-01), None
See Machine Translation of JP 2000-321545.
Kwon Sang-Hyuk
Park Soon-Jae
Yang Kyoung-Ho
Bali Vikkram
Entezari Michelle
F. Chau & Associates LLC
Samsung Electronics Co,. Ltd.
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