Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2005-05-10
2005-05-10
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C702S127000
Reexamination Certificate
active
06892159
ABSTRACT:
A method for tracking repair histories includes providing a field replaceable unit having a memory device. Operational history data is collected during the operation of the field replaceable unit. The operational history data is stored in the memory device. A computing system includes a field replaceable unit including a memory device configured to store operational history data associated with the field replaceable unit.
REFERENCES:
patent: 5068851 (1991-11-01), Bruckert et al.
patent: 5253184 (1993-10-01), Kleinschnitz
patent: 5293556 (1994-03-01), Hill et al.
patent: 5404503 (1995-04-01), Hill et al.
patent: 5867809 (1999-02-01), Soga et al.
patent: 6154728 (2000-11-01), Sattar et al.
patent: 6349268 (2002-02-01), Ketonen et al.
patent: 623 900 (1994-11-01), None
patent: 03014752 (2003-02-01), None
Hewlett Packard, White Paper, “IPMI: Intelligent Platform Management Interface,” Feb. 1998, 5 pages.
Intel, Hewlett-Packard, NEC, Dell, “-IPMI- Platrform Event Trap Format Specification,” v1.0, Revision 1.0, Dec. 7, 1998, 17 pages.
Intel, Hewlett-Packard, NEC, Dell, “-IPMI- IPMB v1.0 Address Allocation,” Revision 1.0, Sep. 16, 1998, 5 pages.
Intel, Hewlett-Packard, NEC, Dell, “-IPMI- Platrform Management FRU Information Storage Definition,” v1.0, Revision 1.1, Sep. 27, 1999, 27 pages.
Atmel Corporation, “2-Wire Serial EEPROM,” Rev. 03361-SEEPR-07/02, 19 pages.
Atmel Corporation, “Interfacing 24CXX Serial EEPROMs,” Rev. 0507D-05/01, 3 pages.
Atmel Corporation, “Atmel's Serial EEPROMs, Solutions for all your design needs,” Jan. 1999, 7 pages.
IDEAS International Pty., Ltd., “Sun-ft-SPARC,” Competitive Profiles, Jan. 27, 1999, 2 pages.
Sun Microsystems, Inc., “Netra ft 1800 Module EEPROM v.4 Data File Specifications,” 1998, 56 pages.
Sun Microsystems, Inc., “Netra ft 1800 Module EEPROM v.4 Data File Specifications, Repair and Reference Fields,” 1998, 32 pages.
Sun Microsystems, Inc., “Netra ft 1800 Module EEPROM v.4 Data File Specifications, RMM-Specific Data,” 1998, 4 pages.
Sun Microsystems, Inc., “Netra ft 1800 Module EEPROM v.4 Data File Specifications, PCI Card-Specific Data,” 1998, 4 pages.
Sun Microsystems, Inc., “Netra ft 1800 Module EEPROM v.4 Data File Specifications, Disk Chassis-Specific Data,” 1998, 4 pages.
Sun Microsystems, Inc., “Netra ft 1800 Module EEPROM v.4 Data File Specifications, Motherboard-Specific Data,” 1998, 6 pages.
Sun Microsystems, Inc., “Netra ft 1800 Module EEPROM v.4 Data File Specifications, CPUset-Specific Data,” 1998, 9 pages.
Sun Microsystems, Inc., “Netra ft 1800 Module EEPROM v.4 Data File Specifications, Generic Data-All Modules,” 1998, 20 pages.
“eeprom—display or alter information in a hardware module's eeprom,” facsimile received on Jan. 31, 2003, printed on May 19, 1993, 2 pages.
Gilstrap Raymond J.
Gordon David S.
Jumper Gregory S.
Weiss Steven E.
Williams Emrys
Merkel Lawrence J.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
Sun Microsystems Inc.
Washburn Douglas N
LandOfFree
Method and system for storing field replaceable unit... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for storing field replaceable unit..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for storing field replaceable unit... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3373274