Method and system for simulating state retention of an RTL...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000

Reexamination Certificate

active

07610571

ABSTRACT:
Method and system for simulating state retention of an RTL design are disclosed. The method includes receiving a netlist description of the circuit represented in a register-transfer-level (RTL) design environment, receiving power information specifications of the circuit, identifying one or more power domains of the circuit using the netlist description and the power information specifications, associating the one or more power domains and the power information specifications in the RTL design environment, where the one or more power domains are controlled by a set of power control signals through a power manager logic, and simulating state retention behavior in response to variations in power applied to the power domain.

REFERENCES:
patent: 6289498 (2001-09-01), Dupenloup
patent: 6779163 (2004-08-01), Bednar et al.
patent: 6820240 (2004-11-01), Bednar et al.
patent: 6883152 (2005-04-01), Bednar et al.
patent: 6901565 (2005-05-01), Sokolov
patent: 7080341 (2006-07-01), Eisenstadt et al.
patent: 7216326 (2007-05-01), Papanikolaou et al.

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