Method and system for semiconductor device characterization...

Details Method and system for semiconductor device characterization... Method and system for semiconductor device characterization...

2006-03-15

2009-08-04

Levin, Naum B (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C716S030000, C716S030000, C714S724000, C714S725000, C703S014000, C703S019000

Reexamination Certificate

active

07571412

ABSTRACT:
A method for generating automatic design characterization patterns for integrated circuits (IC) is provided. The method includes selecting a routing scheme from a file containing the device description of the routings of the IC. The routing scheme may be of a phase locked loop, clock tree, delay element, or input output block in one embodiment. Resource types for the routing scheme are identified and a path is defined, within constraints, between the resources. Once a path is defined, alternate paths are defined by retracing the path within constraints from an end of the path to the beginning of the path. An alternative path is then built and the alternative path shares a portion of the path previously defined. A computing system providing the functionality of the method is also provided.

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