Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2008-01-22
2008-01-22
Ramos-Feliciano, Eliseo (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C702S182000, C702S186000, C702S195000
Reexamination Certificate
active
07321845
ABSTRACT:
A method and system are disclosed for removing very low frequency noise from a time-based data set for use in data analysis of the time-based data set having a plurality of data points, the method comprising providing the time-based data set to be analyzed, determining a baseline value from at least a portion of the data set, smoothing the data set to diminish an effect of extraneous data points and obtain smoothed data, wherein the smoothing includes using a Fast Fourier Transform (FFT) algorithm to transfer the time-based data set into a frequency based data set, attenuating low frequencies of the frequency-based data set and using an inverse Fourier Transform (FFT) algorithm to transfer the attenuated frequency based data set into an attenuated time-based data set.
REFERENCES:
patent: 4634110 (1987-01-01), Julich et al.
patent: 5245665 (1993-09-01), Lewis et al.
patent: 5268938 (1993-12-01), Feig et al.
patent: 5517426 (1996-05-01), Underwood
patent: 6829538 (2004-12-01), de Kok
patent: 7027953 (2006-04-01), Klein
patent: 2005/0259767 (2005-11-01), Garmany et al.
Collin Denis
Matschek Peter
Nguyen Phuc Luong
Ogilvy Renault LLP
Pratt & Whitney Canada Corp.
Ramos-Feliciano Eliseo
Suarez Felix
LandOfFree
Method and system for removing very low frequency noise from... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for removing very low frequency noise from..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for removing very low frequency noise from... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2811412