Method and system for providing fast design for testability...

Details Method and system for providing fast design for testability... Method and system for providing fast design for testability...

2006-11-07

2006-11-07

Lin, Sun James (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C702S181000

Reexamination Certificate

active

07134106

ABSTRACT:
Method and system for providing a computer implemented process of performing design for testability analysis and synthesis in an integrated circuit design includes partitioning each logic block in an integrated circuit design based on one or more boundaries of multi-cycle initial setup sequence, excluding one or more partitioned logic blocks with multi-cycle initial setup sequence from valid candidate blocks, selecting a constraint setting set, extracting a subset of constraint settings from the selected constraint setting set, applying the extracted subset of constraint settings to the integrated circuit design, performing design for testability analysis and synthesis on the valid candidate blocks, performing scan cell replacement. The scan cell replacement may include performing class selection from a cell library and a gate-level netlist based on affinity between cells, determining a target characterization, such as timing, power, area, for example, for the scan cell replacement, and replacing one or more cells with a corresponding one or more scan cells having the closest target characteristics.

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