Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-05-16
2006-05-16
Thompson, A. M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07047510
ABSTRACT:
A method and system for verifying integrated circuit designs through partitioning. In an embodiment, a design is partitioned, then each partition is verified. In one embodiment, the design is partitioned at the granularity of modules. In another embodiment, the design is partitioned at the granularity of instances. In a third embodiment, instances are grouped together, subject to a weight threshold, so as to form possibly overlapping partitions of instances that are contiguous in the design hierarchy, with the purpose of avoiding, to the extent possible, false negatives. In a further embodiment, the design is partitioned to avoid redundant partitions. In an embodiment, model checking is applied to one or more local properties in each partition. In another embodiment, simulation is used to verify each partition.
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Chopra Manu
Du Xiaoqun
Hardin Ronald H.
Jain Alok
Kurshan Robert P.
Bingham & McCutchen LLP
Cadence Design Systems Inc.
Rossoshek Helen
Thompson A. M.
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