Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-10-04
2005-10-04
Smith, Matthew (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
06952818
ABSTRACT:
A computer implemented method for OPC includes: storing an improper OPC pattern and a corrective treatment for the improper OPC pattern in a library storage medium; reading a layout pattern; and matching the layout pattern with the improper OPC pattern stored in the library storage medium.
REFERENCES:
patent: 6077310 (2000-06-01), Yamamoto et al.
patent: 6584609 (2003-06-01), Pierrat et al.
patent: 6622297 (2003-09-01), Uno et al.
patent: 2002/0007481 (2002-01-01), Ono
patent: 2002/0040468 (2002-04-01), Uno et al.
patent: 2000-260879 (2000-09-01), None
patent: 2000-314954 (2000-11-01), None
Holmes Brenda O.
Kabushiki Kaisha Toshiba
Kilpatrick & Stockton LLP
Smith Matthew
Tat Binh
LandOfFree
Method and system for optical proximity correction does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for optical proximity correction, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for optical proximity correction will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3450405