Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2004-10-25
2009-02-24
Nguyen, VanThu (Department: 2824)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S212000, C326S030000
Reexamination Certificate
active
07495985
ABSTRACT:
Memory component temperature information is used to implement a method for ODT (on die termination) thermal load management. A respective temperature of a plurality of memory components are accessed, and based on this temperature, an ODT cycle is directed to a first of the memory components to avoid imposing a thermal load from the ODT cycle on a second of the memory components.
REFERENCES:
patent: 5237460 (1993-08-01), Miller et al.
patent: 6523102 (2003-02-01), Dye et al.
patent: 6545684 (2003-04-01), Dragony et al.
patent: 6704022 (2004-03-01), Aleksic
patent: 6772352 (2004-08-01), Williams et al.
patent: 6832177 (2004-12-01), Khandekar et al.
patent: 6980020 (2005-12-01), Best et al.
patent: 7034565 (2006-04-01), Lee
patent: 7061640 (2006-06-01), Maeda
Johnson, Chris, “Graphics DDR3 On-Die Termination and Thermal Considerations.” Micron Designline, vol. 12, Issue 1. Rev. Apr. 1, 2003. 8 pgs.
Reed David G.
Simeral Brad W.
Surgutchik Roman
Titus Joshua
Nguyen Van-Thu
Nvidia Corporation
LandOfFree
Method and system for memory thermal load sharing using... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for memory thermal load sharing using..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for memory thermal load sharing using... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4113614