Method and system for measuring the imaging quality of an...

Details Method and system for measuring the imaging quality of an... Method and system for measuring the imaging quality of an...

2007-12-11

2007-12-11

Nguyen, Sang H. (Department: 2886)

Optics: measuring and testing

Lens or reflective image former testing

C356S618000, C356S620000, C250S201900, C250S548000, C355S053000, C355S055000

Reexamination Certificate

active

11477393

ABSTRACT:
An object pattern is imaged by an imaging system onto the image plane of the imaging system at a location where a reference pattern suited to the object pattern is situated in order to measure the imaging fidelity of an optical imaging system, for example, an eyeglass lens, a photographic lens, or a projection lens, for use in the visible spectral range. The resultant, two-dimensional, superposition pattern is detected in a spatially resolved manner in order to determine imaging parameters therefrom. The object pattern is generated with the aid of at least one electronically controllable pattern generator that serves as a self-luminous, electronically configurable, incoherent light source and may, for example, have a color monitor. The measuring system allows rapidly, flexibly, checking optical imaging systems with minimal time and effort spent on the mechanical setup required.

REFERENCES:
patent: 3700907 (1972-10-01), Myer et al.
patent: 3912396 (1975-10-01), Hartmann
patent: 4429992 (1984-02-01), Häusler et al.
patent: 4772120 (1988-09-01), Pointeau
patent: 4993826 (1991-02-01), Yoder, Jr.
patent: 5022753 (1991-06-01), Dey
patent: 5062702 (1991-11-01), Bille
patent: 5062705 (1991-11-01), Sato et al.
patent: 5319445 (1994-06-01), Fitts
patent: 5355210 (1994-10-01), Keren et al.
patent: 5424552 (1995-06-01), Tsuji et al.
patent: 5548396 (1996-08-01), Morita et al.
patent: 5631731 (1997-05-01), Sogard
patent: 5635285 (1997-06-01), Bakeman et al.
patent: 5742381 (1998-04-01), Ueno
patent: 5767959 (1998-06-01), Kobayashi
patent: 5796512 (1998-08-01), Wachman et al.
patent: 5872625 (1999-02-01), Kajino et al.
patent: 5883982 (1999-03-01), Riley et al.
patent: 5959726 (1999-09-01), Riley et al.
patent: 5973773 (1999-10-01), Kobayashi
patent: 6034766 (2000-03-01), Sugiura et al.
patent: 6084712 (2000-07-01), Harding
patent: 6693704 (2004-02-01), Ooki et al.
patent: 6763133 (2004-07-01), Park et al.
patent: 6813002 (2004-11-01), Ota
patent: 6816247 (2004-11-01), Heppner et al.
patent: 6977718 (2005-12-01), LaFontaine
patent: 7142284 (2006-11-01), Mishima
patent: 2002/0001088 (2002-01-01), Wegmann et al.
patent: 30 20 022 (1981-12-01), None
patent: 0154 239 (1982-03-01), None
patent: 256 916 (1988-05-01), None
patent: 195 38 747 (1997-04-01), None
patent: 297 24 139 (2000-03-01), None
patent: 101 09 929 (2001-11-01), None
patent: 0 418 054 (1991-03-01), None
Katsuyuki Omura, et al “Phase Measuring Ronchi Test”, Applied Optics, vol. 27, No. 3, pp. 523-528, Feb. 1, 1988.

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