Method and system for managing semiconductor manufacturing...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing

Reexamination Certificate

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Details

C700S109000, C700S110000, C438S014000, C257SE21525

Reexamination Certificate

active

07979154

ABSTRACT:
A management system includes a variable-period setting unit that sets a variable period in which quality-control values vary. Then, a retrieving unit retrieves events sandwiching the variable period. The events can be a maintenance of the semiconductor manufacturing device and/or a change of a correction value. An analysis-period setting unit sets an analysis period for analyzing a cause of variation of the quality-control values between the events retrieved by the retrieving unit.

REFERENCES:
patent: 5607097 (1997-03-01), Sato et al.
patent: 7221991 (2007-05-01), Matsushita et al.
patent: 2003/0054573 (2003-03-01), Tanaka et al.
patent: 2004/0230873 (2004-11-01), Ward
patent: 2005/0194590 (2005-09-01), Matsushita et al.
patent: 2007/0225853 (2007-09-01), Matsushita et al.
patent: 2007/0276528 (2007-11-01), Matsushita et al.
patent: 2005-197323 (2005-07-01), None

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