Method and system for in-situ parametric SRAM diagnosis

Details Method and system for in-situ parametric SRAM diagnosis Method and system for in-situ parametric SRAM diagnosis

2005-03-25

2009-02-24

Elms, Richard (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S189020, C365S230020

Reexamination Certificate

active

07495979

ABSTRACT:
This invention is about a system for diagnosing memory cells in a memory module. A first multiplexer module selectively connects a diagnosis signal in response to a multiplexer control signal to a data line associated with a predetermined memory cell. A second multiplexer module connects the data line to the predetermined memory cell via the bit line in response to a bit selection signals. Similarly, a complement diagnosis signal may be connected to a predetermined memory cell via the complement data line and bit line through the same control and bit select signals. A pair of access pads are provided for passing the diagnosis signal and the complement diagnosis signal for external accessing.

REFERENCES:
patent: 5255230 (1993-10-01), Chan et al.
patent: 6081464 (2000-06-01), Marr
patent: 6081465 (2000-06-01), Wang et al.
patent: 6212115 (2001-04-01), Jordan

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