Method and system for improved ATE timing calibration at a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction

Reexamination Certificate

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C714S741000, C702S089000

Reexamination Certificate

active

07120840

ABSTRACT:
A method for improved ATE (automatic test equipment) timing calibration at a DUT (device under test). The method includes step of accessing a DUT component using an ATE component and performing physical calibration on a first portion of signal pathways coupling the ATE component to the DUT component. A simulation based calibration is performed on a second portion of signal pathways coupling the ATE component to the DUT component. The physical calibration results are combined with simulation based calibration results to calibrate timing propagation delay between the ATE component and the DUT component.

REFERENCES:
patent: 4594677 (1986-06-01), Barlow
patent: 5784299 (1998-07-01), Evers et al.
patent: 6587811 (2003-07-01), Schleifer et al.
patent: 2004/0034838 (2004-02-01), Liau

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