Method and system for high speed measuring of microscopic...

Optics: measuring and testing – Shape or surface configuration – Triangulation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S234000, C359S202100, C359S389000

Reexamination Certificate

active

11102334

ABSTRACT:
A system including confocal and triangulation-based scanners or subsystems provides data which is both acquired and processed under the control of a control algorithm to obtain information such as dimensional information about microscopic targets which may be “non-cooperative.” The “non-cooperative” targets are illuminated with a scanning beam of electromagnetic radiation such as laser light incident from a first direction. A confocal detector of the electromagnetic radiation is placed at a first location for receiving reflected radiation which is substantially optically collinear with the incident beam of electromagnetic radiation. The system includes a spatial filter for attenuating background energy. The triangulation-based subsystem also includes a detector of electromagnetic radiation which is placed at a second location which is non-collinear with respect to the incident beam. This detector has a position sensitive axis. Digital data is derived from signals produced by the detectors. In this way, data from at least one triangulation-based channel is acquired in parallel or sequentially with at least one slice of confocal image data having substantially perfect temporal and spatial registration with the triangulation-based sensor data. This allows for fusion or further processing of the data for use with a predetermined measurement algorithm to thereby obtain information about the targets.

REFERENCES:
patent: 3013467 (1961-12-01), Minsky
patent: 4689491 (1987-08-01), Lindow et al.
patent: 4827125 (1989-05-01), Goldstein
patent: 4863226 (1989-09-01), Houpt et al.
patent: 4873653 (1989-10-01), Grosskopf
patent: 4893008 (1990-01-01), Horikawa
patent: 5024529 (1991-06-01), Svetkoff et al.
patent: 5058178 (1991-10-01), Ray
patent: 5118192 (1992-06-01), Chen
patent: 5153428 (1992-10-01), Ellis
patent: 5239178 (1993-08-01), Derndinger et al.
patent: 5248876 (1993-09-01), Kerstens et al.
patent: 5272517 (1993-12-01), Tokura
patent: 5381236 (1995-01-01), Morgan
patent: 5448359 (1995-09-01), Schick et al.
patent: 5479252 (1995-12-01), Worster et al.
patent: 5483005 (1996-01-01), Etzbach et al.
patent: 5510894 (1996-04-01), Batchelder et al.
patent: 5546189 (1996-08-01), Svetkoff et al.
patent: 5594235 (1997-01-01), Lee
patent: 5617209 (1997-04-01), Svetkoff et al.
patent: 5654800 (1997-08-01), Svetkoff et al.
patent: 5875029 (1999-02-01), Jann et al.
patent: 5932871 (1999-08-01), Nakagawa et al.
patent: 6028671 (2000-02-01), Svetkoff et al.
patent: 6098031 (2000-08-01), Svetkoff et al.
patent: 6177998 (2001-01-01), Svetkoff et al.
patent: 6181425 (2001-01-01), Svetkoff et al.
patent: 6249347 (2001-06-01), Svetkoff et al.
patent: 6366357 (2002-04-01), Svetkoff et al.
patent: 6452686 (2002-09-01), Svetkoff et al.
patent: 6750974 (2004-06-01), Svetkoff et al.
patent: 2003/0184764 (2003-10-01), Svetkoff et al.
patent: 2004/0179207 (2004-09-01), Svetkoff et al.
patent: 2005/0174580 (2005-08-01), Svetkoff et al.
patent: 868341 (1982-02-01), None
patent: WO 98/02716 (1998-01-01), None
Brochure NM-2654A Panasert IP-K-V, “The Rotating Mirror Scan System Inspects Large High-Density PC Boards Quickly and Precisely”, Specifications.
“Dynamic Focusing in the Confocal Scanning Microscope”, T. Wilson and D.K. Hamilton, Journal of Microscopy, vol. 128, Pt. 2, Nov. 1992, pp. 139-143.
“Digital Image Processing of Confocal Images”, I. J. Cox and C.J.R. Sheppard, Image and Vision Computing, vol. 1. No. 1, Feb. 1983, pp. 52-56.
“Three-Dimensional Surface Measurement Using the Confocal Scanning Microscope”, D.K. Hamilton and T. Wilson, Appl. Phys. B 27.211-213 (1982).
“Scanning Optical Microscope Incorporating A Digital Framestore and Microcomputer”, I.J. Cox and C.R. Sheppard. Applied Optics, vol. 22, No. 10, May 15, 1983, pp. 1474-1478.
“Depth of Field in the Scanning Microscope”, C.J.R. Sheppard and T. Wilson, Optics Letters, Sep. 1978. vol. 3, No. 3, pp. 115-117.
“NLB Laser Inspector, NLB-7700M Specifications”, Nagoya Electric Works Co., Ltd. Dec. 1994.
“Automatic Inspection of Component Boards Using 3D and Greyscale Vision”, Donald J. Svetkoff, David N. Smith and Brian L. Doss, Proceedings of the 1986 International Symposium on Microelectronics, pp. 57-64.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and system for high speed measuring of microscopic... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for high speed measuring of microscopic..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for high speed measuring of microscopic... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3722267

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.