Method and system for hard failure repairs in the field

Details Method and system for hard failure repairs in the field Method and system for hard failure repairs in the field

2007-10-02

2007-10-02

Elms, Richard T. (Department: 2824)

Static information storage and retrieval

Read/write circuit

Having fuse element

C326S039000, C326S010000, C326S012000, C326S013000, C365S200000, C365S201000, C365S185090

Reexamination Certificate

active

11012877

ABSTRACT:
A semiconductor system and method for repairing failures of a packaged integrated circuit system are provided. The method includes detecting a failure associated with a packaged integrated circuit system after the packaged integrated circuit system is packaged, and repairing the failure by activating a redundancy circuit in the packaged integrated circuit system and deactivating a defective circuit associated with the failure. The process for repairing the failure includes applying a repair voltage to a polysilicon fuse to change a conductivity state of the polysilicon fuse from a first state to a second state. In another embodiment, the polysilicon fuse is replaced by a metal fuse, an anti-fuse, or a non-volatile random access memory.

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