Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2005-11-30
2008-10-14
Beausoliel, Jr., Robert W (Department: 2113)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S041000, C714S745000
Reexamination Certificate
active
07437620
ABSTRACT:
Disclosed are embodiments of a method and an associated first system for extending product life of a second system in the presence of phenomena that cause the exhibition of both performance degradation and recovery properties within system devices. The first system includes duplicate devices incorporated into the second system (e.g., on a shared bus). These duplicate devices are adapted to independently perform the same function within that second system. Reference signal generators, a reference signal comparator, a power controller and a state machine, working in combination, can be adapted to seamlessly switch performance of that same function within the second system between the duplicate devices based on a measurement of performance degradation to allow for device recovery. A predetermined policy accessible by the state machine dictates when and whether or not to initiate a switch.
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Laura Peters, “NBTI: A Growing Threat to Device Reliability,” http://www.reed-electronics.com/semiconductor/index.asp?layout=articlePrint&articleID=..., Mar. 1, 2004, 5 pages.
Goodnow Kenneth J.
Shuma Stephen G.
Strohacker Oscar C.
Styduhar Mark S.
Twombly Peter A.
Beausoliel, Jr. Robert W
Ehne Charles
Gibb & Rahman, LLC
International Business Machines - Corporation
LeStrange, Esq. Michael
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