Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-02-27
2009-06-30
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07555740
ABSTRACT:
Methods, systems and computer program products for analyzing a timing design of an integrated circuit are disclosed. According to an embodiment, a method for analyzing a timing design of an integrated circuit comprises: providing an initial static timing analysis of the integrated circuit; selecting a static timing test with respect to a static timing test point based on the initial static timing analysis; selecting a timing path leading to the static timing test point for the static timing test; determining an integrated slack path variability for the timing path based on a joint probability distribution of at least one statistically independent parameter; and analyzing the timing design based on the integrated slack path variability.
REFERENCES:
patent: 6046984 (2000-04-01), Grodstein et al.
patent: 6080201 (2000-06-01), Hojat et al.
patent: 6604227 (2003-08-01), Foltin et al.
patent: 6851098 (2005-02-01), Schultz
patent: 7092838 (2006-08-01), Srinivas et al.
patent: 7111260 (2006-09-01), Visweswariah
patent: 7117466 (2006-10-01), Kalafala et al.
patent: 2004/0002844 (2004-01-01), Jess et al.
patent: 2004/0044976 (2004-03-01), Schultz
patent: 2005/0065765 (2005-03-01), Visweswariah
patent: 2005/0066297 (2005-03-01), Kalafala et al.
patent: 2005/0114811 (2005-05-01), Schultz
patent: 2005/0172250 (2005-08-01), Kucukcakar et al.
patent: 2005/0246116 (2005-11-01), Foreman et al.
patent: 2008/0072198 (2008-03-01), Celik et al.
patent: 2005141434 (2005-06-01), None
Lee W. Young, “PCT International Search Report,” International Business Machines Corporation, Jul. 31, 2008, 3 pages.
Buck Nathan C.
Dubuque John P.
Foreman Eric A.
Habitz Peter A.
Kalafala Kerim
Do Thuan
Hoffman Warnick LLC
International Business Machines - Corporation
Simmons Ryan K.
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